X-Rite Benchtop Spectrophotometers (Ci7860)
Sphere Benchtop Spectrophotometers (Ci7860)
Type of Product : Spectrophotometer
Type of Business :
Coating ,Cosmetics & Pharmaceutical ,Food ,Garment ,Leather ,Non Woven ,Paper ,Plastic ,Retail Paint ,Textile
Brand :
Product Details
Ci7860
For the Most Accurate and Precise Measurement
- Ideal for digital color standard generation
- Offers ≤0.06 dE* inter-instrument agreement and ≤0.01 dE*repeatability
- Provides measurement flexibility with switchable reflectance and optional transmission apertures
Establish the Strictest Color Standards
Creating standards requires the most advanced color measurement instrument available. The Ci7860 delivers 25% tighter specifications than any other industrial instrument, consuming less of the tolerance allocated for color variation with instrument variability. Built-in temperature and humidity sensors ensure the environment is suitable, and embedded NetProfiler status lights verify the device is optimized for each measurement. Standards created with the Ci7860 can be used for each stage of the product development process, from formulation to final production to quality control.
Versatile Control for Opaque, Transparent, Translucent, and Fluorescent Samples
The Ci7860 offers up to five reflectance and four transmission apertures to measure color and appearance on a wide range of samples in port up, port down, and port forward positions. It can be fitted with various accessories to measure textured materials, odd shapes, liquids, powders, and gels, and uses up to 3 UV filters to control optical brighteners in textiles, plastics, paint, coatings, and paper.
Ensure Operator Confidence and Maximize Productivity
The Ci7860 delivers consistent configuration across all locations and eliminates the potential for error using automated, software-driven setup. The on-board digital camera with preview and active targeting guarantees accurate selection of measurement area. It can also capture images for future retrieval so any smudges, scratches or imperfections can be detected and accompany the measurement data for audit.
