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Home Our Products X-Rite Benchtop Spectrophotometers (Ci7800)
X-Rite Benchtop Spectrophotometers (Ci7800)
Sphere Benchtop Spectrophotometers (Ci7800)
Type of Product : SpectroPhotometer
Type of Business : Coating ,Cosmatic & Pharmaceutical ,Food ,Garment ,leahter ,Non woven ,Paper ,Plastic ,Retail Paint ,Textile
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Product Details

Ci7800
For the Most Precise Measurement

  • Ideal for supply chain
  • Offers ≤0.08 dE* inter-instrument agreement and ≤0.01 dE*repeatability
  • Provides measurement flexibility with switchable reflectance and optional transmission apertures

Measurement Reliability Across the Supply Chain

Like the Ci7600, the Ci7800 can measure opaque, translucent, and transparent samples. However, with tighter inter-instrument agreement and repeatability, it's ideal for manufacturers that need to seamlessly communicate, share, and coordinate color-critical values and specifications. The Ci7800 works with X-Rite Color iQC quality assurance software to quickly identify whether a sample is within tolerance, and if not, provides direct feedback to get it on target. Embedded NetProfiler status lights verify device is optimized for measurement performance
 
 
Versatile Control for Opaque, Transparent, Translucent, and Fluorescent Samples
The Ci7800 offers up to five reflectance and four transmission apertures to measure color and appearance on a wide range of samples in port up, port down, and port forward positions. It can be fitted with various accessories to measure textured materials, odd shapes, liquids, powders, and gels, and uses up to 3 UV filters to control optical brighteners in textiles, plastics, paint, coatings, and paper.
 

Ensure Operator Confidence and Consistent Measurements
The Ci7800 delivers consistent configuration across all locations and eliminates the potential for error using automated, software-driven setup. The on-board digital camera with preview and active targeting (remove the word to) guarantee accurate sample targeting. It can also capture images for future retrieval so any smudges, scratches or imperfections can be detected and accompany the measurement data for audit.